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Rocky Mountain Nanotechnology, LLC
Welcome to RMN, home of the world's sharpest solid metallic AFM probe tips

Probe Characteristics
Probes are ideal for SCM and C-AFM imaging
  • Tip radius below 10nm
  • Solid probes have no metal adhesion problems
  • Cantilever frequencies from 4.5kHz to 100kHz
  • Cantilever length 200µm, 300µm or 400µm
  • Tip shank length 80µm
  • FE-SEM image of each probe available

Rocky Mountain Nanotechnology:

  • Manufactures ultra-sharp solid metallic scanning probes (radius below 10nm)
  • Provides consulting and nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)

The founder, Dr. Clayton Williams, has over 30 years experience in the Scanning Probe Microscopy field. Click here to view his University of Utah bio.

The company also specializes in cross-sectional & top surface Scanning Capacitance Microscopy Measurements of semiconductor materials and devices (carrier and dopant mapping).

 © 2018 Rocky Mountain Nanotechnology, LLC

 3300 E Millcreek Canyon Rd, Salt Lake City, UT 84109  probes@rmnano.com  801-230-9811(Phone)  801-657-4703(Fax)

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