Rocky Mountain Nanotechnology, LLC
Welcome to RMN, home of the world's sharpest solid metallic AFM probe tips
Probes are ideal for SCM and C-AFM imaging
Probe Characteristics
- Tip radius below 20 nm - some below 10
- Solid probes have no metal adhesion problems
- Spring constant ~ 0.3N/m to 18N/m
- Cantilever length 300µm or 400µm
- Tip shank length ~ 80µm
- FE-SEM image of each probe available
Rocky Mountain Nanotechnology:
- Manufactures ultra-sharp solid metallic scanning probes (radius below 20nm)
- Provides consulting and nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)
The founder, Dr. Clayton Williams, has 20 years experience in the Scanning Probe Microscopy field. Click here to view his University of Utah bio.
The company specializes in cross-sectional & top surface Scanning Capacitance Microscopy Measurements of semiconductor materials and devices (carrier and dopand mapping).
© 2012 Rocky Mountain Nanotechnology, LLC
3300 E Milldreek Rd, Salt Lake City, UT 84109 rmnanotech@comcast.net 801-230-9811(Phone) 801-657-4703(Fax)
