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Rocky Mountain Nanotechnology, LLC
Welcome to RMN, home of the world's sharpest solid metallic AFM probe tips







Probe Characteristics
Probes are ideal for SCM and C-AFM imaging
  • Tip radius below 10nm
  • Solid probes have no metal adhesion problems
  • Cantilever frequencies from 4.5kHz to 100kHz
  • Cantilever length 200µm, 300µm or 400µm
  • Tip shank length 80µm
  • FE-SEM image of each probe available

Rocky Mountain Nanotechnology:

  • Manufactures ultra-sharp solid metallic scanning probes (radius below 10nm)
  • Provides consulting and nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)

The founder, Dr. Clayton Williams, has 30 years experience in the Scanning Probe Microscopy field. Click here to view his University of Utah bio.

The company also specializes in cross-sectional & top surface Scanning Capacitance Microscopy Measurements of semiconductor materials and devices (carrier and dopant mapping).

 © 2016 Rocky Mountain Nanotechnology, LLC

 3300 E Millcreek Rd, Salt Lake City, UT 84109  probes@rmnano.com  801-230-9811(Phone)  801-657-4703(Fax)

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