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  • X ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells
    • Chang et al; ACSnano.org, Vol8 No2 1584-1589 (2014)

  • Polarization dependent switching of asymmetric nanorings with a circular field
    • Pradhan, Tuominen, and Aidala AIP Advances 6, 015302 (2016)

  • Near-field microwave microscopy of high-j oxides grown on graphene with an organic seeding layer
    • Tselev et al; Appl. Phys. Lett. 103, 243105 (2013)

  • Manipulation of magnetization states of ferromagnetic nanorings by an applied azimuthal Oersted field
    • Yang et al; Appl. Phys. Lett. 98, 242505 (2011)

  • Contrast distortion induced by modulation voltage in scanning capacitance microscopy
    • Chang et al; Appl. Phys. Lett. 101, 083503 (2012)

  • Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extraction
    • K. Wong and W. Chim Appl. Phys. Lett. 91, 013510 (2007)

  • Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy
    • Gramse et al. Biophysical Journal 104(6) 1257–1262 (2013)

  • Ferroelectric behavior of bismuth titanate thin films grown via magnetron sputtering
    • C.M. Bedoya-Hincapié et al. Ceramics International 40 11831–11836 (2014)

  • Mechanical properties and applications of custom-built gold AFM cantilevers
    • V.A. Kolchuzhin et al. Mechatronics 0 0 0 1–6 (2016)

  • Measurement of Electron Transfer through Cytochrome P450 Protein on Nanopillars and the Effect of Bound Substrates
    • Jett et al. J Am Chem Soc. 135(10) (2013)

  • Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact
    • Golt et al. J. Appl. Phys. 120, 024302 (2016)

  • Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
    • Wong et al. J. Appl. Phys. 103, 054505 (2008)

  • Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy
    • Wood et al. J. Phys. Chem. C, 119, 11459−11467 (2015)

  • Interplay between Ferroelastic and Metal-Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2 Nanoplatelets
    • Tselev et al Nano Lett. 10, 2003–2011 (2010)

  • Switching of ± 360° domain wall states in a nanoring by an azimuthal Oersted field
    • Pradhan et al. Nanotechnology 22 485705 (4pp) (2011)

  • Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies
    • G Gramse et al. Nanotechnology 24 415709 (2013)

  • Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
    • G Gramse et al Nanotechnology 25 145703 (2014)

  • Quantitative impedance characterization of sub-10nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
    • F Wang et al Nanotechnology 25 405703 F Wang (2014)

  • Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
    • G Gramse et al Nanotechnology 26 135701 (2015)

  • Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy
    • S-S Tuca et al Nanotechnology 27 135702 (2016)

  • Charge gradient microscopy
    • Hong et al. PNAS vol. 111 no. 18 6567 (2014)

  • An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
    • Dargent et al. Rev. Sci. Instrum. 84, 123705 (2013)

  • Electrical current through individual pairs of phosphorus donor atoms and silicon dangling bonds
    • K. Ambal et al Scientific Reports 6:18531 (2016)

  • Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy
    • Choi et al Scientific Reports 6:25087 (2016)
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