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Technical Data

25Pt200B-H or 25Pt200A-H*

The 25Pt200B-H is the high-spring constant RMN probe. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for EFM and KPFM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 200 µm (± 15%)
  • Cantilever width: 50 µm (± 15%)
  • Spring constant: 250 N/m (± 40%)
  • Frequency: 100 kHz (± 30%)
  • Tip radius: < 20 nm for $80 each
    Tip radius: < 10 nm for $100 each 25Pt200B-H10
    • This is an introductory rate, available for a limited time!
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25Pt300B or 25Pt300A*

The 25Pt300B is RMN’s most popular probe. This versatile probe is a good choice for many applications. These probes are ideal for C-AFM, SCM, SMM, SMIM, EFM and KPFM.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 300 µm (± 15%)
  • Cantilever width: 110 µm (± 15%)
  • Spring constant: 18 N/m (± 40%)
  • Frequency: 20 kHz (± 30%)
  • Tip radius: < 20 nm for $80 each
    Tip radius: < 10 nm for $100 each 25Pt300B-10
    • This is an introductory rate, available for a limited time!

12Pt400B or 12Pt400A*

The 12Pt400B is RMN’s probe with the lowest spring constant. It is most useful for contact AFM measurements with minimum contact force. These probes are ideal for C-AFM, SCM, SMM and SMIM applications. The 12Pt400A is the preferred probe for Keysigh (Agilent) SMM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 400 µm (± 15%)
  • Cantilever width: 60 µm (± 15%)
  • Spring constant: 0.3 N/m (± 40%)
  • Frequency: 4.5 kHz (± 30%)
  • Tip radius: < 20 nm for $80 each
    Tip radius: < 10 nm for $100 each 12Pt400B-10
    • This is an introductory rate, available for a limited time!

25Pt400B or 25Pt400A*

The 25Pt400B is similar to the 25Pt300B, but with a lower spring constant. It is often used when a smaller spring constant is needed. These probes are ideal for C-AFM, SCM, SMM and SMIM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 400 µm (± 15%)
  • Cantilever width: 110 µm (± 15%)
  • Spring constant: 8 N/m (± 40%)
  • Frequency: 10 kHz (± 30%)
  • Tip radius: < 20 nm for $80 each

12Pt300B or 12Pt300A*

The 12Pt300B has a higher spring constant than the 12Pt400B. It is typically used for contact AFM imaging, when a higher resonance frequency is desired. These probes are ideal for C-AFM, SCM, SMM and SMIM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 300 µm (± 15%)
  • Cantilever width: 60 µm (± 15%)
  • Spring constant: 0.8 N/m (± 40%)
  • Frequency: 9 kHz (± 30%)
  • Tip radius: < 20 nm for $80 each
  • Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.

  • Probes on standard sized substrate have a part number ending in the letter B (i.e. 25Pt300B).

  • *Probes designed specifically for the Keysight (Agilent) Scanning Microwave Microscope (SMM) add on end with the letter A rather than B (i.e. 12Pt400A).

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25PtIr300B or 25PtIr300A*

The 25PtIr300B is the updated version of RMN’s most popular probe, with prolonged mechanical wear. This versatile probe is a good choice for many applications. These probes are ideal for C-AFM, SCM, SMM, SMIM, EFM and KPFM.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 300 µm (± 15%)
  • Cantilever width: 100 µm (± 15%)
  • Spring constant: 22 N/m (± 40%)
  • Frequency: 21 kHz (± 30%)
  • Tip radius: < 20 nm for $100 each
    Tip radius: < 10 nm for $120 each 25PtIr300B-10

25PtIr200B-H or 25PtIr200A-H*

The 25PtIr200B-H is the updated version of RMN’s high frequency probe, with prolonged mechanical wear. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for EFM and KPFM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 200 µm (± 15%)
  • Cantilever width: 50 µm (± 15%)
  • Spring constant: 290 N/m (± 40%)
  • Frequency: 105 kHz (± 30%)
  • Tip radius: < 20 nm for $100 each
    Tip radius: < 10 nm for $120 each 25PtIr200B-H10

12PtIr400B or 12PtIr400A*

The 12PtIr400B is the updated version of RMN’s probe with the lowest spring constant, with prolonged mechanical wear. It is most useful for contact AFM measurements with minimum contact force. These probes are ideal for C-AFM, SCM, SMM and SMIM applications.The 12PtIr400A is the preferred probe for Keysight (Agilent) SMM applications.

  • Tip shank length: 80 μm (± 25%)
  • Cantilever length: 400 µm (± 15%)
  • Cantilever width: 50 µm (± 15%)
  • Spring constant: 0.6 N/m (± 40%)
  • Frequency: 6 kHz (± 30%)
  • Tip radius: < 20 nm for $100 each
    Tip radius: < 10 nm for $120 each 12PtIr400B-10