Welcome to Rocky Mountain Nanotechnology, LLC,
Home of the World's sharpest solid metallic AFM probe tips
Our Products
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Applications
Tapping/ Non Contact Mode Atomic Force Microscopy
Contact Mode Atomic Force Microscopy
Conductive Atomic Force Microscopy (CAFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Piezoresponse/Piezoforce Microscopy (PFM)
Scanning Capacitance Microscopy (SCM)
Scanning Microwave Microscopy (SMM)
Scanning Microwave Impedance Microscopy (SMIM)
Scanning Nearfield Optical Microscopy (SNOM)
NanoIR and THZ applications
RMN probes have been featured in many publications. View publications here.
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Probe Characteristics
RMN manufactures ultra-sharp solid metallic scanning probes
Standard Tip Radius of 20nm
Variable Tip Radius from 10nm to 1 um on request
Solid probes have no metal adhesion problems
Cantilever frequencies from 4.5kHz to 105kHz
Standard cantilever lengths of 200µm, 300µm or 400µm
Standard tip shank length of 80µm
FE-SEM image of each probe available
Non-standard cantilever length, tip shank length, and tip radius can be manufactured upon request
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Services
RMN provides consulting on nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)