Welcome to Rocky Mountain Nanotechnology, LLC,
Home of the World's sharpest solid metallic AFM probe tips

Our Products

  • Side View of Probe (Front)

    Applications

    • Tapping/ Non Contact Mode Atomic Force Microscopy

    • Contact Mode Atomic Force Microscopy

    • Conductive Atomic Force Microscopy (CAFM)

    • Electrostatic Force Microscopy (EFM)

    • Kelvin Probe Force Microscopy (KPFM)

    • Piezoresponse/Piezoforce Microscopy (PFM)

    • Scanning Capacitance Microscopy (SCM)

    • Scanning Microwave Microscopy (SMM)

    • Scanning Microwave Impedance Microscopy (SMIM)

    • Scanning Nearfield Optical Microscopy (SNOM)

    • NanoIR and THZ applications

    RMN probes have been featured in many publications. View publications here.

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    Probe Characteristics

    RMN manufactures ultra-sharp solid metallic scanning probes

    • Standard Tip Radius of 20nm

    • Variable Tip Radius from 10nm to 1 um on request

    • Solid probes have no metal adhesion problems

    • Cantilever frequencies from 4.5kHz to 105kHz

    • Standard cantilever lengths of 200µm, 300µm or 400µm

    • Standard tip shank length of 80µm

    • FE-SEM image of each probe available

    • Non-standard cantilever length, tip shank length, and tip radius can be manufactured upon request

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    Services

    RMN provides consulting on nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.)