25Pt300B or 25Pt300A

The 25Pt300B is RMN’s most popular probe. This versatile probe is a good choice for many applications. These probes are ideal for C-AFM, SCM, SMM, SMIM, EFM and KPFM.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 300 µm (± 15%)

• Cantilever width: 110 µm (± 15%)

• Spring constant: 18 N/m (± 40%)

• Frequency: 20 kHz (± 30%)

• Standard tip radii below 20 nm for $90 each

• Tip radii below 10 nm on request for $112 each 25Pt300B-10

• Non - standard probe tips and cantilevers upon request

25PtIr300B or 25PtIr300A

The 25PtIr300B is the updated version of RMN’s most popular probe, with prolonged mechanical wear. This versatile probe is a good choice for many applications and can be used in various modes, including tapping and contact. These probes are ideal for C-AFM, SCM, SMM, SMIM, EFM and KPFM.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 300 µm (± 15%)

• Cantilever width: 100 µm (± 15%)

• Spring constant: 22 N/m (± 40%)

• Frequency: 21 kHz (± 30%)

• Standard tip radii below 20 nm for $112 each

• Tip radii below 10 nm on request for $134 each 25PtIr300B-10

• Non - standard probe tips and cantilevers upon request

Technical Data

25PtIr200B-H or 25PtIr200A-H

The 25PtIr200B-H is the updated version of RMN’s high frequency probe, with prolonged mechanical wear. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for THz-SNOM, SNOM and high Frequency applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 200 µm (± 15%)

• Cantilever width: 50 µm (± 15%)

• Spring constant: 290 N/m (± 40%)

• Frequency: 105 kHz (± 30%)

• Standard tip radii below 20 nm for $112 each

• Tip radii below 10 nm on request for $134 each 25PtIr200B-H10

• Non - standard probe tips and cantilevers upon request

12PtIr400B or 12PtIr400A

The 12PtIr400B is the updated version of RMN’s probe with the lowest spring constant, with prolonged mechanical wear. It is most useful for contact AFM measurements with minimum contact force. These probes are ideal for C-AFM, SCM, SMM and SMIM applications.The 12PtIr400A is the preferred probe for Keysight (Agilent) SMM applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 400 µm (± 15%)

• Cantilever width: 50 µm (± 15%)

• Spring constant: 0.6 N/m (± 40%)

• Frequency: 6 kHz (± 30%)

• Standard tip radii below 20 nm for $112 each

• Tip radii below 10 nm on request for $134 each 12PtIr400B-10

• Non - standard probe tips and cantilevers upon request

25Pt400B or 25Pt400A

The 25Pt400B is similar to the 25Pt300B, but with a lower spring constant. These probes are ideal for C-AFM, SCM, SMM and SMIM applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 400 µm (± 15%)

• Cantilever width: 110 µm (± 15%)

• Spring constant: 8 N/m (± 40%)

• Frequency: 10 kHz (± 30%)

• Standard tip radii below 20 nm for $90 each

• Tip radii below 10 nm on request for $112 each 25Pt400B-10

• Non - standard probe tips and cantilevers upon request

12Pt400B or 12Pt400A

The 12Pt400B is RMN’s probe with the lowest spring constant. It is most useful for contact AFM measurements with minimum contact force. These probes are ideal for C-AFM, SCM, SMM and SMIM applications. The 12Pt400A is the preferred probe for Keysight (Agilent) SMM applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 400 µm (± 15%)

• Cantilever width: 60 µm (± 15%)

• Spring constant: 0.3 N/m (± 40%)

• Frequency: 4.5 kHz (± 30%)

• Standard tip radii below 20 nm for $90 each

• Tip radii below 10 nm on request for $112 each 12Pt400B-10

• Non - standard probe tips and cantilevers upon request

25Pt200B-H or 25Pt200A-H

The 25Pt200B-H is the high-spring constant RMN probe. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for high Frequency applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 200 µm (± 15%)

• Cantilever width: 50 µm (± 15%)

• Spring constant: 250 N/m (± 40%)

• Frequency: 100 kHz (± 30%)

• Standard tip radii below 20 nm for $90 each

• Tip radii below 10 nm on request for $112 each 25Pt200B-H10

• Non - standard probe tips and cantilevers upon request

12Pt300B or 12Pt300A

The 12Pt300B has a higher spring constant than the 12Pt400B. It is typically used for contact AFM imaging, when a higher resonance frequency is desired. These probes are ideal for C-AFM, SCM, SMM, SMIM, and PFM applications.

• Tip shank length: 80 μm (± 25%)

• Cantilever length: 300 µm (± 15%)

• Cantilever width: 60 µm (± 15%)

• Spring constant: 0.8 N/m (± 40%)

• Frequency: 9 kHz (± 30%)

• Standard tip radii below 20 nm for $90 each

• Tip radii below 10 nm on request for $112 each 12Pt300B-10

• Non - standard probe tips and cantilevers upon request